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Label-free optical imaging of membrane patches for atomic force microscopy

In atomic force microscopy (AFM), finding sparsely distributed regions of interest can be difficult and time-consuming. Typically, the tip is scanned until the desired object is located. This process can mechanically or chemically degrade the tip, as well as damage fragile biological samples. Protei...

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Detalles Bibliográficos
Autores principales: Churnside, Allison B., King, Gavin M., Perkins, Thomas T.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Optical Society of America 2010
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3158999/
https://www.ncbi.nlm.nih.gov/pubmed/21164738
http://dx.doi.org/10.1364/OE.18.023924
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author Churnside, Allison B.
King, Gavin M.
Perkins, Thomas T.
author_facet Churnside, Allison B.
King, Gavin M.
Perkins, Thomas T.
author_sort Churnside, Allison B.
collection PubMed
description In atomic force microscopy (AFM), finding sparsely distributed regions of interest can be difficult and time-consuming. Typically, the tip is scanned until the desired object is located. This process can mechanically or chemically degrade the tip, as well as damage fragile biological samples. Protein assemblies can be detected using the back-scattered light from a focused laser beam. We previously used back-scattered light from a pair of laser foci to stabilize an AFM. In the present work, we integrate these techniques to optically image patches of purple membranes prior to AFM investigation. These rapidly acquired optical images were aligned to the subsequent AFM images to ~40 nm, since the tip position was aligned to the optical axis of the imaging laser. Thus, this label-free imaging efficiently locates sparsely distributed protein assemblies for subsequent AFM study while simultaneously minimizing degradation of the tip and the sample.
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spelling pubmed-31589992011-08-21 Label-free optical imaging of membrane patches for atomic force microscopy Churnside, Allison B. King, Gavin M. Perkins, Thomas T. Opt Express Research-Article In atomic force microscopy (AFM), finding sparsely distributed regions of interest can be difficult and time-consuming. Typically, the tip is scanned until the desired object is located. This process can mechanically or chemically degrade the tip, as well as damage fragile biological samples. Protein assemblies can be detected using the back-scattered light from a focused laser beam. We previously used back-scattered light from a pair of laser foci to stabilize an AFM. In the present work, we integrate these techniques to optically image patches of purple membranes prior to AFM investigation. These rapidly acquired optical images were aligned to the subsequent AFM images to ~40 nm, since the tip position was aligned to the optical axis of the imaging laser. Thus, this label-free imaging efficiently locates sparsely distributed protein assemblies for subsequent AFM study while simultaneously minimizing degradation of the tip and the sample. Optical Society of America 2010-10-29 /pmc/articles/PMC3158999/ /pubmed/21164738 http://dx.doi.org/10.1364/OE.18.023924 Text en ©2010 Optical Society of America http://creativecommons.org/licenses/by-nc-nd/3.0 This is an open-access article distributed under the terms of the Creative Commons Attribution-Noncommercial-No Derivative Works 3.0 Unported License, which permits download and redistribution, provided that the original work is properly cited. This license restricts the article from being modified or used commercially.
spellingShingle Research-Article
Churnside, Allison B.
King, Gavin M.
Perkins, Thomas T.
Label-free optical imaging of membrane patches for atomic force microscopy
title Label-free optical imaging of membrane patches for atomic force microscopy
title_full Label-free optical imaging of membrane patches for atomic force microscopy
title_fullStr Label-free optical imaging of membrane patches for atomic force microscopy
title_full_unstemmed Label-free optical imaging of membrane patches for atomic force microscopy
title_short Label-free optical imaging of membrane patches for atomic force microscopy
title_sort label-free optical imaging of membrane patches for atomic force microscopy
topic Research-Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3158999/
https://www.ncbi.nlm.nih.gov/pubmed/21164738
http://dx.doi.org/10.1364/OE.18.023924
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