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Label-free optical imaging of membrane patches for atomic force microscopy
In atomic force microscopy (AFM), finding sparsely distributed regions of interest can be difficult and time-consuming. Typically, the tip is scanned until the desired object is located. This process can mechanically or chemically degrade the tip, as well as damage fragile biological samples. Protei...
Autores principales: | Churnside, Allison B., King, Gavin M., Perkins, Thomas T. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Optical Society of America
2010
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3158999/ https://www.ncbi.nlm.nih.gov/pubmed/21164738 http://dx.doi.org/10.1364/OE.18.023924 |
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