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Automatic Defect Detection for TFT-LCD Array Process Using Quasiconformal Kernel Support Vector Data Description
Defect detection has been considered an efficient way to increase the yield rate of panels in thin film transistor liquid crystal display (TFT-LCD) manufacturing. In this study we focus on the array process since it is the first and key process in TFT-LCD manufacturing. Various defects occur in the...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Molecular Diversity Preservation International (MDPI)
2011
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3189749/ https://www.ncbi.nlm.nih.gov/pubmed/22016625 http://dx.doi.org/10.3390/ijms12095762 |