Cargando…
Microscopic study of electrical properties of CrSi(2 )nanocrystals in silicon
Semiconducting CrSi(2 )nanocrystallites (NCs) were grown by reactive deposition epitaxy of Cr onto n-type silicon and covered with a 50-nm epitaxial silicon cap. Two types of samples were investigated: in one of them, the NCs were localized near the deposition depth, and in the other they migrated n...
| Autores principales: | , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2011
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211265/ https://www.ncbi.nlm.nih.gov/pubmed/21711727 http://dx.doi.org/10.1186/1556-276X-6-209 |