Combining scanning probe microscopy and x-ray spectroscopy

A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Resu...

Descripción completa

Detalles Bibliográficos
Autores principales: Fauquet, Carole, Dehlinger, Maël, Jandard, Franck, Ferrero, Sylvain, Pailharey, Daniel, Larcheri, Sylvia, Graziola, Roberto, Purans, Juris, Bjeoumikhov, Aniouar, Erko, Alexei, Zizak, Ivo, Dahmani, Brahim, Tonneau, Didier
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211394/
https://www.ncbi.nlm.nih.gov/pubmed/21711848
http://dx.doi.org/10.1186/1556-276X-6-308

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211394/
https://www.ncbi.nlm.nih.gov/pubmed/21711848
http://dx.doi.org/10.1186/1556-276X-6-308

Ejemplares similares