Combining scanning probe microscopy and x-ray spectroscopy

A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Resu...

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Autores principales: Fauquet, Carole, Dehlinger, Maël, Jandard, Franck, Ferrero, Sylvain, Pailharey, Daniel, Larcheri, Sylvia, Graziola, Roberto, Purans, Juris, Bjeoumikhov, Aniouar, Erko, Alexei, Zizak, Ivo, Dahmani, Brahim, Tonneau, Didier
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211394/
https://www.ncbi.nlm.nih.gov/pubmed/21711848
http://dx.doi.org/10.1186/1556-276X-6-308
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author Fauquet, Carole
Dehlinger, Maël
Jandard, Franck
Ferrero, Sylvain
Pailharey, Daniel
Larcheri, Sylvia
Graziola, Roberto
Purans, Juris
Bjeoumikhov, Aniouar
Erko, Alexei
Zizak, Ivo
Dahmani, Brahim
Tonneau, Didier
author_facet Fauquet, Carole
Dehlinger, Maël
Jandard, Franck
Ferrero, Sylvain
Pailharey, Daniel
Larcheri, Sylvia
Graziola, Roberto
Purans, Juris
Bjeoumikhov, Aniouar
Erko, Alexei
Zizak, Ivo
Dahmani, Brahim
Tonneau, Didier
author_sort Fauquet, Carole
collection PubMed
description A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO(4 )thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.
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spelling pubmed-32113942011-11-09 Combining scanning probe microscopy and x-ray spectroscopy Fauquet, Carole Dehlinger, Maël Jandard, Franck Ferrero, Sylvain Pailharey, Daniel Larcheri, Sylvia Graziola, Roberto Purans, Juris Bjeoumikhov, Aniouar Erko, Alexei Zizak, Ivo Dahmani, Brahim Tonneau, Didier Nanoscale Res Lett Nano Express A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO(4 )thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented. Springer 2011-04-07 /pmc/articles/PMC3211394/ /pubmed/21711848 http://dx.doi.org/10.1186/1556-276X-6-308 Text en Copyright ©2011 Fauquet et al; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Nano Express
Fauquet, Carole
Dehlinger, Maël
Jandard, Franck
Ferrero, Sylvain
Pailharey, Daniel
Larcheri, Sylvia
Graziola, Roberto
Purans, Juris
Bjeoumikhov, Aniouar
Erko, Alexei
Zizak, Ivo
Dahmani, Brahim
Tonneau, Didier
Combining scanning probe microscopy and x-ray spectroscopy
title Combining scanning probe microscopy and x-ray spectroscopy
title_full Combining scanning probe microscopy and x-ray spectroscopy
title_fullStr Combining scanning probe microscopy and x-ray spectroscopy
title_full_unstemmed Combining scanning probe microscopy and x-ray spectroscopy
title_short Combining scanning probe microscopy and x-ray spectroscopy
title_sort combining scanning probe microscopy and x-ray spectroscopy
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211394/
https://www.ncbi.nlm.nih.gov/pubmed/21711848
http://dx.doi.org/10.1186/1556-276X-6-308
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