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Scaling properties of ballistic nano-transistors

Recently, we have suggested a scale-invariant model for a nano-transistor. In agreement with experiments a close-to-linear thresh-old trace was found in the calculated I(D )- V(D)-traces separating the regimes of classically allowed transport and tunneling transport. In this conference contribution,...

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Detalles Bibliográficos
Autores principales: Wulf, Ulrich, Krahlisch, Marcus, Richter, Hans
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211455/
https://www.ncbi.nlm.nih.gov/pubmed/21711899
http://dx.doi.org/10.1186/1556-276X-6-365

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