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III-Nitride grating grown on freestanding HfO(2 )gratings

We report here the epitaxial growth of III-nitride material on freestanding HfO(2 )gratings by molecular beam epitaxy. Freestanding HfO(2 )gratings are fabricated by combining film evaporation, electron beam lithography, and fast atom beam etching of an HfO(2 )film by a front-side silicon process. T...

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Autores principales: Wang, Yongjin, Wu, Tong, Hu, Fangren, Kanamori, Yoshiaki, Zhu, Hongbo, Hane, Kazuhiro
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3212012/
https://www.ncbi.nlm.nih.gov/pubmed/21849084
http://dx.doi.org/10.1186/1556-276X-6-497
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author Wang, Yongjin
Wu, Tong
Hu, Fangren
Kanamori, Yoshiaki
Zhu, Hongbo
Hane, Kazuhiro
author_facet Wang, Yongjin
Wu, Tong
Hu, Fangren
Kanamori, Yoshiaki
Zhu, Hongbo
Hane, Kazuhiro
author_sort Wang, Yongjin
collection PubMed
description We report here the epitaxial growth of III-nitride material on freestanding HfO(2 )gratings by molecular beam epitaxy. Freestanding HfO(2 )gratings are fabricated by combining film evaporation, electron beam lithography, and fast atom beam etching of an HfO(2 )film by a front-side silicon process. The 60-μm long HfO(2 )grating beam can sustain the stress change during the epitaxial growth of a III-nitride material. Grating structures locally change the growth condition and vary indium composition in the InGaN/GaN quantum wells and thus, the photoluminescence spectra of epitaxial III-nitride grating are tuned. Guided mode resonances are experimentally demonstrated in fabricated III-nitride gratings, opening the possibility to achieve the interaction between the excited light and the grating structure through guided mode resonance. PACS: 78.55.Cr; 81.65.Cf; 81.15.Hi.
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spelling pubmed-32120122011-11-09 III-Nitride grating grown on freestanding HfO(2 )gratings Wang, Yongjin Wu, Tong Hu, Fangren Kanamori, Yoshiaki Zhu, Hongbo Hane, Kazuhiro Nanoscale Res Lett Nano Express We report here the epitaxial growth of III-nitride material on freestanding HfO(2 )gratings by molecular beam epitaxy. Freestanding HfO(2 )gratings are fabricated by combining film evaporation, electron beam lithography, and fast atom beam etching of an HfO(2 )film by a front-side silicon process. The 60-μm long HfO(2 )grating beam can sustain the stress change during the epitaxial growth of a III-nitride material. Grating structures locally change the growth condition and vary indium composition in the InGaN/GaN quantum wells and thus, the photoluminescence spectra of epitaxial III-nitride grating are tuned. Guided mode resonances are experimentally demonstrated in fabricated III-nitride gratings, opening the possibility to achieve the interaction between the excited light and the grating structure through guided mode resonance. PACS: 78.55.Cr; 81.65.Cf; 81.15.Hi. Springer 2011-08-18 /pmc/articles/PMC3212012/ /pubmed/21849084 http://dx.doi.org/10.1186/1556-276X-6-497 Text en Copyright ©2011 Wang et al; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Nano Express
Wang, Yongjin
Wu, Tong
Hu, Fangren
Kanamori, Yoshiaki
Zhu, Hongbo
Hane, Kazuhiro
III-Nitride grating grown on freestanding HfO(2 )gratings
title III-Nitride grating grown on freestanding HfO(2 )gratings
title_full III-Nitride grating grown on freestanding HfO(2 )gratings
title_fullStr III-Nitride grating grown on freestanding HfO(2 )gratings
title_full_unstemmed III-Nitride grating grown on freestanding HfO(2 )gratings
title_short III-Nitride grating grown on freestanding HfO(2 )gratings
title_sort iii-nitride grating grown on freestanding hfo(2 )gratings
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3212012/
https://www.ncbi.nlm.nih.gov/pubmed/21849084
http://dx.doi.org/10.1186/1556-276X-6-497
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