Characterization of MHz pulse repetition rate femtosecond laser-irradiated gold-coated silicon surfaces

In this study, MHz pulse repetition rate femtosecond laser-irradiated gold-coated silicon surfaces under ambient condition were characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction analysis (XRD), and X-ray photoelectron spectroscopy (XPS). T...

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Detalles Bibliográficos
Autores principales: Sivakumar, Manickam, Venkatakrishnan, Krishnan, Tan, Bo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3212226/
https://www.ncbi.nlm.nih.gov/pubmed/21711595
http://dx.doi.org/10.1186/1556-276X-6-78

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3212226/
https://www.ncbi.nlm.nih.gov/pubmed/21711595
http://dx.doi.org/10.1186/1556-276X-6-78

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