Accurate Permittivity Measurements for Microwave Imaging via Ultra-Wideband Removal of Spurious Reflectors

The use of microwave imaging is becoming more prevalent for detection of interior hidden defects in manufactured and packaged materials. In applications for detection of hidden moisture, microwave tomography can be used to image the material and then perform an inverse calculation to derive an estim...

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Detalles Bibliográficos
Autores principales: Pelletier, Mathew G., Viera, Joseph A., Wanjura, John, Holt, Greg
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2010
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3231232/
https://www.ncbi.nlm.nih.gov/pubmed/22163668
http://dx.doi.org/10.3390/s100908491

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3231232/
https://www.ncbi.nlm.nih.gov/pubmed/22163668
http://dx.doi.org/10.3390/s100908491

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