Cathodoluminescence and Cross-sectional Transmission Electron Microscopy Studies for Deformation Behaviors of GaN Thin Films Under Berkovich Nanoindentation

In this study, details of Berkovich nanoindentation-induced mechanical deformation mechanisms of metal-organic chemical-vapor deposition-derived GaN thin films have been systematic investigated with the aid of the cathodoluminescence (CL) and the cross-sectional transmission electron microscopy (XTE...

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Detalles Bibliográficos
Autores principales: Jian, Sheng-Rui, Teng, I-Ju, Lu, Jian-Ming
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2008
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3244797/
http://dx.doi.org/10.1007/s11671-008-9130-8

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3244797/
http://dx.doi.org/10.1007/s11671-008-9130-8

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