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Deep Level Transient Spectroscopy in Quantum Dot Characterization

Deep level transient spectroscopy (DLTS) for investigating electronic properties of self-assembled InAs/GaAs quantum dots (QDs) is described in an approach, where experimental and theoretical DLTS data are compared in a temperature-voltage representation. From such comparative studies, the main mech...

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Detalles Bibliográficos
Autores principales: Engström, O, Kaniewska, M
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2008
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3244859/
http://dx.doi.org/10.1007/s11671-008-9133-5