Site-controlled quantum dots fabricated using an atomic-force microscope assisted technique

An atomic-force microscope assisted technique is developed to control the position and size of self-assembled semiconductor quantum dots (QDs). Presently, the site precision is as good as ± 1.5 nm and the size fluctuation is within ± 5% with the minimum controllable lateral diameter of 20 nm. With t...

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Detalles Bibliográficos
Autores principales: Song, HZ, Usuki, T, Ohshima, T, Sakuma, Y, Kawabe, M, Okada, Y, Takemoto, K, Miyazawa, T, Hirose, S, Nakata, Y, Takatsu, M, Yokoyama, N
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2006
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3246671/
http://dx.doi.org/10.1007/s11671-006-9012-x

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3246671/
http://dx.doi.org/10.1007/s11671-006-9012-x

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