Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

Odd electron diffraction patterns (EDPs) have been obtained by transmission electron microscopy (TEM) on silicon nanowires grown via the vapour–liquid–solid method and on silicon thin films deposited by electron beam evaporation. Many explanations have been given in the past, without consensus among...

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Detalles Bibliográficos
Autores principales: Cayron, Cyril, Den Hertog, Martien, Latu-Romain, Laurence, Mouchet, Céline, Secouard, Christopher, Rouviere, Jean-Luc, Rouviere, Emmanuelle, Simonato, Jean-Pierre
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2009
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3246813/
https://www.ncbi.nlm.nih.gov/pubmed/22477767
http://dx.doi.org/10.1107/S0021889808042131

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3246813/
https://www.ncbi.nlm.nih.gov/pubmed/22477767
http://dx.doi.org/10.1107/S0021889808042131

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