Simplistic Attachment and Multispectral Imaging with Semiconductor Nanocrystals

Advances in spectral deconvolution technologies are rapidly enabling researchers to replace or enhance traditional epifluorescence microscopes with instruments capable of detecting numerous markers simultaneously in a multiplexed fashion. While significantly expediting sample throughput and elucidat...

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Detalles Bibliográficos
Autores principales: Jennings, Travis L., Triulzi, Robert C., Tao, Guoliang, St. Louis, Zachary E., Becker-Catania, Sara G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2011
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3274300/
https://www.ncbi.nlm.nih.gov/pubmed/22346658
http://dx.doi.org/10.3390/s111110557

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3274300/
https://www.ncbi.nlm.nih.gov/pubmed/22346658
http://dx.doi.org/10.3390/s111110557

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