A Coupled Field Multiphysics Modeling Approach to Investigate RF MEMS Switch Failure Modes under Various Operational Conditions

In this paper, the reliability of capacitive shunt RF MEMS switches have been investigated using three dimensional (3D) coupled multiphysics finite element (FE) analysis. The coupled field analysis involved three consecutive multiphysics interactions. The first interaction is characterized as a two-...

Descripción completa

Detalles Bibliográficos
Autores principales: Sadek, Khaled, Lueke, Jonathan, Moussa, Walied
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2009
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3286834/
https://www.ncbi.nlm.nih.gov/pubmed/22408490
http://dx.doi.org/10.3390/s91007988

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3286834/
https://www.ncbi.nlm.nih.gov/pubmed/22408490
http://dx.doi.org/10.3390/s91007988

Ejemplares similares