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Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe
Background: Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution images on a wide range of surfaces, and has demonstrated the capability for atomic manipulation solely using chemical forces. Nonetheless, the role of the tip apex in both imaging and manipulation remain...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2012
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3304327/ https://www.ncbi.nlm.nih.gov/pubmed/22428093 http://dx.doi.org/10.3762/bjnano.3.3 |