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Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

Background: Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution images on a wide range of surfaces, and has demonstrated the capability for atomic manipulation solely using chemical forces. Nonetheless, the role of the tip apex in both imaging and manipulation remain...

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Detalles Bibliográficos
Autores principales: Sweetman, Adam, Jarvis, Sam, Danza, Rosanna, Moriarty, Philip
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2012
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3304327/
https://www.ncbi.nlm.nih.gov/pubmed/22428093
http://dx.doi.org/10.3762/bjnano.3.3

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