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Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe
Background: Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution images on a wide range of surfaces, and has demonstrated the capability for atomic manipulation solely using chemical forces. Nonetheless, the role of the tip apex in both imaging and manipulation remain...
Autores principales: | Sweetman, Adam, Jarvis, Sam, Danza, Rosanna, Moriarty, Philip |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2012
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3304327/ https://www.ncbi.nlm.nih.gov/pubmed/22428093 http://dx.doi.org/10.3762/bjnano.3.3 |
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