Genetic Architecture of Highly Complex Chemical Resistance Traits across Four Yeast Strains

Many questions about the genetic basis of complex traits remain unanswered. This is in part due to the low statistical power of traditional genetic mapping studies. We used a statistically powerful approach, extreme QTL mapping (X-QTL), to identify the genetic basis of resistance to 13 chemicals in...

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Detalles Bibliográficos
Autores principales: Ehrenreich, Ian M., Bloom, Joshua, Torabi, Noorossadat, Wang, Xin, Jia, Yue, Kruglyak, Leonid
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2012
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3305394/
https://www.ncbi.nlm.nih.gov/pubmed/22438822
http://dx.doi.org/10.1371/journal.pgen.1002570

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3305394/
https://www.ncbi.nlm.nih.gov/pubmed/22438822
http://dx.doi.org/10.1371/journal.pgen.1002570

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