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Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy
In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods prop...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2012
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3323913/ https://www.ncbi.nlm.nih.gov/pubmed/22496997 http://dx.doi.org/10.3762/bjnano.3.27 |