Non-equidistant scanning approach for millimetre-sized SPM measurements

Long-range scanning probe microscope (SPM) measurements are usually extremely time consuming as many data need to be collected, and the microscope probe speed is limited. In this article, we present an adaptive measurement method for a large-area SPM. In contrast to the typically used line by line s...

Descripción completa

Detalles Bibliográficos
Autores principales: Klapetek, Petr, Valtr, Miroslav, Buršík, Petr
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3352299/
https://www.ncbi.nlm.nih.gov/pubmed/22587490
http://dx.doi.org/10.1186/1556-276X-7-213

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3352299/
https://www.ncbi.nlm.nih.gov/pubmed/22587490
http://dx.doi.org/10.1186/1556-276X-7-213

Ejemplares similares