Label-free, atomic force microscopy-based mapping of DNA intrinsic curvature for the nanoscale comparative analysis of bent duplexes

We propose a method for the characterization of the local intrinsic curvature of adsorbed DNA molecules. It relies on a novel statistical chain descriptor, namely the ensemble averaged product of curvatures for two nanosized segments, symmetrically placed on the contour of atomic force microscopy im...

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Detalles Bibliográficos
Autores principales: Buzio, Renato, Repetto, Luca, Giacopelli, Francesca, Ravazzolo, Roberto, Valbusa, Ugo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Oxford University Press 2012
Materias:
Methods Online
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3367213/
https://www.ncbi.nlm.nih.gov/pubmed/22402493
http://dx.doi.org/10.1093/nar/gks210

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3367213/
https://www.ncbi.nlm.nih.gov/pubmed/22402493
http://dx.doi.org/10.1093/nar/gks210

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