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Deterministic conversion between memory and threshold resistive switching via tuning the strong electron correlation
Intensive investigations have been launched worldwide on the resistive switching (RS) phenomena in transition metal oxides due to both fascinating science and potential applications in next generation nonvolatile resistive random access memory (RRAM) devices. It is noteworthy that most of these oxid...
Autores principales: | Peng, Hai Yang, Li, Yong Feng, Lin, Wei Nan, Wang, Yu Zhan, Gao, Xing Yu, Wu, Tom |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2012
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3369197/ https://www.ncbi.nlm.nih.gov/pubmed/22679556 http://dx.doi.org/10.1038/srep00442 |
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