Repulsive bimodal atomic force microscopy on polymers

Bimodal atomic force microscopy can provide high-resolution images of polymers. In the bimodal operation mode, two eigenmodes of the cantilever are driven simultaneously. When examining polymers, an effective mechanical contact is often required between the tip and the sample to obtain compositional...

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Detalles Bibliográficos
Autores principales: Gigler, Alexander M, Dietz, Christian, Baumann, Maximilian, Martinez, Nicolás F, García, Ricardo, Stark, Robert W
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2012
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3388370/
https://www.ncbi.nlm.nih.gov/pubmed/23016150
http://dx.doi.org/10.3762/bjnano.3.52

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3388370/
https://www.ncbi.nlm.nih.gov/pubmed/23016150
http://dx.doi.org/10.3762/bjnano.3.52

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