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Tailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm films

The effect of surface roughness on the Seebeck coefficient in the sub-50-nm scale silicon ultra thin films is investigated theoretically using nonequilibrium Green's function formalism. For systematic studies, the surface roughness is modelled by varying thickness periodically with square wave...

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Detalles Bibliográficos
Autores principales: Kumar, Manoj, Bagga, Anjana, Neeleshwar, S
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3395578/
https://www.ncbi.nlm.nih.gov/pubmed/22390685
http://dx.doi.org/10.1186/1556-276X-7-169