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Tailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm films
The effect of surface roughness on the Seebeck coefficient in the sub-50-nm scale silicon ultra thin films is investigated theoretically using nonequilibrium Green's function formalism. For systematic studies, the surface roughness is modelled by varying thickness periodically with square wave...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2012
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3395578/ https://www.ncbi.nlm.nih.gov/pubmed/22390685 http://dx.doi.org/10.1186/1556-276X-7-169 |