Carbon-fiber tips for scanning probe microscopes and molecular electronics experiments

We fabricate and characterize carbon-fiber tips for their use in combined scanning tunneling and force microscopy based on piezoelectric quartz tuning fork force sensors. An electrochemical fabrication procedure to etch the tips is used to yield reproducible sub-100-nm apex. We also study electron t...

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Detalles Bibliográficos
Autores principales: Rubio-Bollinger, Gabino, Castellanos-Gomez, Andres, Bilan, Stefan, Zotti, Linda A, Arroyo, Carlos R, Agraït, Nicolás, Cuevas, Juan Carlos
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3431272/
https://www.ncbi.nlm.nih.gov/pubmed/22587692
http://dx.doi.org/10.1186/1556-276X-7-254

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3431272/
https://www.ncbi.nlm.nih.gov/pubmed/22587692
http://dx.doi.org/10.1186/1556-276X-7-254

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