Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be...

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Detalles Bibliográficos
Autores principales: Baykara, Mehmet Z, Dagdeviren, Omur E, Schwendemann, Todd C, Mönig, Harry, Altman, Eric I, Schwarz, Udo D
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2012
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3458610/
https://www.ncbi.nlm.nih.gov/pubmed/23019560
http://dx.doi.org/10.3762/bjnano.3.73

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3458610/
https://www.ncbi.nlm.nih.gov/pubmed/23019560
http://dx.doi.org/10.3762/bjnano.3.73

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