The use of artificial neural networks in electrostatic force microscopy

The use of electrostatic force microscopy (EFM) to characterize and manipulate surfaces at the nanoscale usually faces the problem of dealing with systems where several parameters are not known. Artificial neural networks (ANNs) have demonstrated to be a very useful tool to tackle this type of probl...

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Detalles Bibliográficos
Autores principales: Castellano-Hernández, Elena, Rodríguez, Francisco B, Serrano, Eduardo, Varona, Pablo, Sacha, Gomez Monivas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3461489/
https://www.ncbi.nlm.nih.gov/pubmed/22587580
http://dx.doi.org/10.1186/1556-276X-7-250

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3461489/
https://www.ncbi.nlm.nih.gov/pubmed/22587580
http://dx.doi.org/10.1186/1556-276X-7-250

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