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Non-Destructive Inspection Methods for LEDs Using Real-Time Displaying Optical Coherence Tomography

In this study, we report the applicability of two different Optical Coherence Tomography (OCT) technologies for inspecting Light Emitting Diode (LED) structures. Sectional images of a LED were captured using a Spectral Domain OCT (SD-OCT) system and a Swept Source OCT (SS-OCT) system. Their center w...

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Detalles Bibliográficos
Autores principales: Cho, Nam Hyun, Jung, Unsang, Kim, Suhwan, Kim, Jeehyun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2012
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3472834/
https://www.ncbi.nlm.nih.gov/pubmed/23112606
http://dx.doi.org/10.3390/s120810395