Resistive switching of Au/ZnO/Au resistive memory: an in situ observation of conductive bridge formation

A special chip for direct and real-time observation of resistive changes, including set and reset processes based on Au/ZnO/Au system inside a transmission electron microscope (TEM), was designed. A clear conducting bridge associated with the migration of Au nanoparticles (NPs) inside a defective Zn...

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Detalles Bibliográficos
Autores principales: Peng, Chung-Nan, Wang, Chun-Wen, Chan, Tsung-Cheng, Chang, Wen-Yuan, Wang, Yi-Chung, Tsai, Hung-Wei, Wu, Wen-Wei, Chen, Lih-Juann, Chueh, Yu-Lun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3494527/
https://www.ncbi.nlm.nih.gov/pubmed/23043767
http://dx.doi.org/10.1186/1556-276X-7-559

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3494527/
https://www.ncbi.nlm.nih.gov/pubmed/23043767
http://dx.doi.org/10.1186/1556-276X-7-559

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