X-ray absorption near edge spectroscopy with a superconducting detector for nitrogen dopants in SiC

Fluorescence-yield X-ray absorption fine structure (FY-XAFS) is extensively used for investigating atomic-scale local structures around specific elements in functional materials. However, conventional FY-XAFS instruments frequently cannot cover trace light elements, for example dopants in wide gap s...

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Detalles Bibliográficos
Autores principales: Ohkubo, M., Shiki, S., Ukibe, M., Matsubayashi, N., Kitajima, Y., Nagamachi, S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2012
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3496949/
https://www.ncbi.nlm.nih.gov/pubmed/23152937
http://dx.doi.org/10.1038/srep00831

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3496949/
https://www.ncbi.nlm.nih.gov/pubmed/23152937
http://dx.doi.org/10.1038/srep00831

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