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The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods
We report on the use of scanning force microscopy as a versatile tool for the electrical characterization of nanoscale memristors fabricated on ultrathin La(0.7)Sr(0.3)MnO(3) (LSMO) films. Combining conventional conductive imaging and nanoscale lithography, reversible switching between low-resistive...
Autores principales: | Moreno, César, Munuera, Carmen, Obradors, Xavier, Ocal, Carmen |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2012
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3512122/ https://www.ncbi.nlm.nih.gov/pubmed/23213636 http://dx.doi.org/10.3762/bjnano.3.82 |
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