Non-rigid image registration to reduce beam-induced blurring of cryo-electron microscopy images

The typical dose used to record cryo-electron microscopy images from vitrified biological specimens is so high that radiation-induced structural alterations are bound to occur during data acquisition. Integration of all scattered electrons into one image can lead to significant blurring, particularl...

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Detalles Bibliográficos
Autores principales: Karimi Nejadasl, Fatemeh, Karuppasamy, Manikandan, Newman, Emily R., McGeehan, John E., Ravelli, Raimond B. G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
Radiation Damage
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3526921/
https://www.ncbi.nlm.nih.gov/pubmed/23254656
http://dx.doi.org/10.1107/S0909049512044408

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3526921/
https://www.ncbi.nlm.nih.gov/pubmed/23254656
http://dx.doi.org/10.1107/S0909049512044408

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