Analysis of the 3D distribution of stacked self-assembled quantum dots by electron tomography

The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shaped specimen preparation and electron tomograph...

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Detalles Bibliográficos
Autores principales: Hernández-Saz, Jesús, Herrera, Miriam, Alonso-Álvarez, Diego, Molina, Sergio I
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3534247/
https://www.ncbi.nlm.nih.gov/pubmed/23249477
http://dx.doi.org/10.1186/1556-276X-7-681

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3534247/
https://www.ncbi.nlm.nih.gov/pubmed/23249477
http://dx.doi.org/10.1186/1556-276X-7-681

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