Analysis of the 3D distribution of stacked self-assembled quantum dots by electron tomography

The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shaped specimen preparation and electron tomograph...

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Detalles Bibliográficos
Autores principales: Hernández-Saz, Jesús, Herrera, Miriam, Alonso-Álvarez, Diego, Molina, Sergio I
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3534247/
https://www.ncbi.nlm.nih.gov/pubmed/23249477
http://dx.doi.org/10.1186/1556-276X-7-681
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author Hernández-Saz, Jesús
Herrera, Miriam
Alonso-Álvarez, Diego
Molina, Sergio I
author_facet Hernández-Saz, Jesús
Herrera, Miriam
Alonso-Álvarez, Diego
Molina, Sergio I
author_sort Hernández-Saz, Jesús
collection PubMed
description The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shaped specimen preparation and electron tomography. We show that conventional 2D measurements of the distribution of QDs are not reliable, and only 3D analysis allows an accurate correlation between the growth design and the structural characteristics.
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spelling pubmed-35342472013-01-03 Analysis of the 3D distribution of stacked self-assembled quantum dots by electron tomography Hernández-Saz, Jesús Herrera, Miriam Alonso-Álvarez, Diego Molina, Sergio I Nanoscale Res Lett Nano Express The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shaped specimen preparation and electron tomography. We show that conventional 2D measurements of the distribution of QDs are not reliable, and only 3D analysis allows an accurate correlation between the growth design and the structural characteristics. Springer 2012-12-18 /pmc/articles/PMC3534247/ /pubmed/23249477 http://dx.doi.org/10.1186/1556-276X-7-681 Text en Copyright ©2012 Hernández-Saz et al.; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Nano Express
Hernández-Saz, Jesús
Herrera, Miriam
Alonso-Álvarez, Diego
Molina, Sergio I
Analysis of the 3D distribution of stacked self-assembled quantum dots by electron tomography
title Analysis of the 3D distribution of stacked self-assembled quantum dots by electron tomography
title_full Analysis of the 3D distribution of stacked self-assembled quantum dots by electron tomography
title_fullStr Analysis of the 3D distribution of stacked self-assembled quantum dots by electron tomography
title_full_unstemmed Analysis of the 3D distribution of stacked self-assembled quantum dots by electron tomography
title_short Analysis of the 3D distribution of stacked self-assembled quantum dots by electron tomography
title_sort analysis of the 3d distribution of stacked self-assembled quantum dots by electron tomography
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3534247/
https://www.ncbi.nlm.nih.gov/pubmed/23249477
http://dx.doi.org/10.1186/1556-276X-7-681
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