Cargando…
Analysis of the 3D distribution of stacked self-assembled quantum dots by electron tomography
The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shaped specimen preparation and electron tomograph...
| Autores principales: | , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2012
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3534247/ https://www.ncbi.nlm.nih.gov/pubmed/23249477 http://dx.doi.org/10.1186/1556-276X-7-681 |