Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a “mechano-electrochemical pen”, locally activating a passivated substrate surface for site-selective electrochemical deposit...

Descripción completa

Detalles Bibliográficos
Autores principales: Obermair, Christian, Kress, Marina, Wagner, Andreas, Schimmel, Thomas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2012
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3557521/
https://www.ncbi.nlm.nih.gov/pubmed/23365795
http://dx.doi.org/10.3762/bjnano.3.92

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3557521/
https://www.ncbi.nlm.nih.gov/pubmed/23365795
http://dx.doi.org/10.3762/bjnano.3.92

Ejemplares similares