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Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope
We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a “mechano-electrochemical pen”, locally activating a passivated substrate surface for site-selective electrochemical deposit...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2012
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3557521/ https://www.ncbi.nlm.nih.gov/pubmed/23365795 http://dx.doi.org/10.3762/bjnano.3.92 |