Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica

Photoluminescence spectroscopy and atom probe tomography were used to explore the optical activity and microstructure of Er(3+)-doped Si-rich SiO(2) thin films fabricated by radio-frequency magnetron sputtering. The effect of post-fabrication annealing treatment on the properties of the films was in...

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Detalles Bibliográficos
Autores principales: Talbot, Etienne, Lardé, Rodrigue, Pareige, Philippe, Khomenkova, Larysa, Hijazi, Khalil, Gourbilleau, Fabrice
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3564724/
https://www.ncbi.nlm.nih.gov/pubmed/23336324
http://dx.doi.org/10.1186/1556-276X-8-39

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3564724/
https://www.ncbi.nlm.nih.gov/pubmed/23336324
http://dx.doi.org/10.1186/1556-276X-8-39

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