Effects of shutter transients in molecular beam epitaxy

We have studied the effects of shutter transients (STs) in molecular beam epitaxy (MBE). Two series of samples were grown by MBE and evaluated by X-ray diffraction (XRD) and X-ray reflectivity (XRR) measurements. The effects of STs were evaluated by growth rate (GR) analysis using a combination of g...

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Detalles Bibliográficos
Autores principales: Gozu, Shin-ichiro, Mozume, Teruo, Kuwatsuka, Haruhiko, Ishikawa, Hiroshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3570454/
https://www.ncbi.nlm.nih.gov/pubmed/23140140
http://dx.doi.org/10.1186/1556-276X-7-620

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3570454/
https://www.ncbi.nlm.nih.gov/pubmed/23140140
http://dx.doi.org/10.1186/1556-276X-7-620

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