Thin film deposition of metal oxides in resistance switching devices: electrode material dependence of resistance switching in manganite films

The electric-pulse-induced resistance switching in layered structures composed of polycrystalline Pr(1−x)Ca(x)MnO(3) (PCMO) sandwiched between Pt bottom electrode and top electrodes of various metals (metal/PCMO/Pt) was studied by direct current current–voltage (I-V) measurements and alternating cur...

Descripción completa

Detalles Bibliográficos
Autores principales: Nakamura, Toshihiro, Homma, Kohei, Tachibana, Kunihide
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3577670/
https://www.ncbi.nlm.nih.gov/pubmed/23414549
http://dx.doi.org/10.1186/1556-276X-8-76

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3577670/
https://www.ncbi.nlm.nih.gov/pubmed/23414549
http://dx.doi.org/10.1186/1556-276X-8-76

Ejemplares similares