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Thin film deposition of metal oxides in resistance switching devices: electrode material dependence of resistance switching in manganite films

The electric-pulse-induced resistance switching in layered structures composed of polycrystalline Pr(1−x)Ca(x)MnO(3) (PCMO) sandwiched between Pt bottom electrode and top electrodes of various metals (metal/PCMO/Pt) was studied by direct current current–voltage (I-V) measurements and alternating cur...

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Detalles Bibliográficos
Autores principales:	Nakamura, Toshihiro, Homma, Kohei, Tachibana, Kunihide
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Springer 2013
Materias:	Nano Express
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3577670/ https://www.ncbi.nlm.nih.gov/pubmed/23414549 http://dx.doi.org/10.1186/1556-276X-8-76

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