High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

The recent achievement of atomic resolution with dynamic atomic force microscopy (dAFM) [Fukuma et al., Appl. Phys. Lett. 2005, 87, 034101], where quality factors of the oscillating probe are inherently low, challenges some accepted beliefs concerning sensitivity and resolution in dAFM imaging modes...

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Detalles Bibliográficos
Autores principales: Melcher, John, Martínez-Martín, David, Jaafar, Miriam, Gómez-Herrero, Julio, Raman, Arvind
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2013
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3596120/
https://www.ncbi.nlm.nih.gov/pubmed/23503468
http://dx.doi.org/10.3762/bjnano.4.15

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3596120/
https://www.ncbi.nlm.nih.gov/pubmed/23503468
http://dx.doi.org/10.3762/bjnano.4.15

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