Self-interference fluorescence microscopy: three dimensional fluorescence imaging without depth scanning

We present a new method for high-resolution, three-dimensional fluorescence imaging. In contrast to beam-scanning confocal microscopy, where the laser focus must be scanned both laterally and axially to collect a volume, we obtain depth information without the necessity of depth scanning. In this me...

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Detalles Bibliográficos
Autores principales: de Groot, Mattijs, Evans, Conor L., de Boer, Johannes F.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Optical Society of America 2012
Materias:
Research-Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3601652/
https://www.ncbi.nlm.nih.gov/pubmed/22772223
http://dx.doi.org/10.1364/OE.20.015253

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3601652/
https://www.ncbi.nlm.nih.gov/pubmed/22772223
http://dx.doi.org/10.1364/OE.20.015253

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