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Self-interference fluorescence microscopy: three dimensional fluorescence imaging without depth scanning
We present a new method for high-resolution, three-dimensional fluorescence imaging. In contrast to beam-scanning confocal microscopy, where the laser focus must be scanned both laterally and axially to collect a volume, we obtain depth information without the necessity of depth scanning. In this me...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Optical Society of America
2012
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3601652/ https://www.ncbi.nlm.nih.gov/pubmed/22772223 http://dx.doi.org/10.1364/OE.20.015253 |