X-ray based tools for the investigation of buried interfaces in organic electronic devices

X-ray reflectivity combined with grazing incidence diffraction is a valuable tool for investigating organic multilayer structures that can be used in devices. We focus on a bilayer stack consisting of two materials (poly-(3-hexylthiophene)) (P3HT) and poly-(4-styrenesulfonic acid) (PSSA) spin cast f...

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Detalles Bibliográficos
Autores principales: Neuhold, Alfred, Brandner, Hannes, Ausserlechner, Simon J., Lorbek, Stefan, Neuschitzer, Markus, Zojer, Egbert, Teichert, Christian, Resel, Roland
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier Science 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3608035/
https://www.ncbi.nlm.nih.gov/pubmed/23565069
http://dx.doi.org/10.1016/j.orgel.2012.11.016

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3608035/
https://www.ncbi.nlm.nih.gov/pubmed/23565069
http://dx.doi.org/10.1016/j.orgel.2012.11.016

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