Automatic XAFS measurement system developed at BL14B2 in SPring-8

A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical comp...

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Detalles Bibliográficos
Autores principales: Oji, Hiroshi, Taniguchi, Yosuke, Hirayama, Sayaka, Ofuchi, Hironori, Takagaki, Masashi, Honma, Tetsuo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2012
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3621170/
https://www.ncbi.nlm.nih.gov/pubmed/22186644
http://dx.doi.org/10.1107/S0909049511042518

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3621170/
https://www.ncbi.nlm.nih.gov/pubmed/22186644
http://dx.doi.org/10.1107/S0909049511042518

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