Automatic XAFS measurement system developed at BL14B2 in SPring-8

A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical comp...

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Detalles Bibliográficos
Autores principales: Oji, Hiroshi, Taniguchi, Yosuke, Hirayama, Sayaka, Ofuchi, Hironori, Takagaki, Masashi, Honma, Tetsuo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2012
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3621170/
https://www.ncbi.nlm.nih.gov/pubmed/22186644
http://dx.doi.org/10.1107/S0909049511042518
Descripción
Sumario:A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical components has also been automated. It not only saves manpower and measurement time, but also improves the accuracy and reliability of sample alignments.

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