Automatic XAFS measurement system developed at BL14B2 in SPring-8

A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical comp...

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Detalles Bibliográficos
Autores principales: Oji, Hiroshi, Taniguchi, Yosuke, Hirayama, Sayaka, Ofuchi, Hironori, Takagaki, Masashi, Honma, Tetsuo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2012
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3621170/
https://www.ncbi.nlm.nih.gov/pubmed/22186644
http://dx.doi.org/10.1107/S0909049511042518
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author Oji, Hiroshi
Taniguchi, Yosuke
Hirayama, Sayaka
Ofuchi, Hironori
Takagaki, Masashi
Honma, Tetsuo
author_facet Oji, Hiroshi
Taniguchi, Yosuke
Hirayama, Sayaka
Ofuchi, Hironori
Takagaki, Masashi
Honma, Tetsuo
author_sort Oji, Hiroshi
collection PubMed
description A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical components has also been automated. It not only saves manpower and measurement time, but also improves the accuracy and reliability of sample alignments.
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spelling pubmed-36211702013-04-12 Automatic XAFS measurement system developed at BL14B2 in SPring-8 Oji, Hiroshi Taniguchi, Yosuke Hirayama, Sayaka Ofuchi, Hironori Takagaki, Masashi Honma, Tetsuo J Synchrotron Radiat Research Papers A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical components has also been automated. It not only saves manpower and measurement time, but also improves the accuracy and reliability of sample alignments. International Union of Crystallography 2012-01-01 2011-11-15 /pmc/articles/PMC3621170/ /pubmed/22186644 http://dx.doi.org/10.1107/S0909049511042518 Text en © Hiroshi Oji et al. 2012 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Oji, Hiroshi
Taniguchi, Yosuke
Hirayama, Sayaka
Ofuchi, Hironori
Takagaki, Masashi
Honma, Tetsuo
Automatic XAFS measurement system developed at BL14B2 in SPring-8
title Automatic XAFS measurement system developed at BL14B2 in SPring-8
title_full Automatic XAFS measurement system developed at BL14B2 in SPring-8
title_fullStr Automatic XAFS measurement system developed at BL14B2 in SPring-8
title_full_unstemmed Automatic XAFS measurement system developed at BL14B2 in SPring-8
title_short Automatic XAFS measurement system developed at BL14B2 in SPring-8
title_sort automatic xafs measurement system developed at bl14b2 in spring-8
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3621170/
https://www.ncbi.nlm.nih.gov/pubmed/22186644
http://dx.doi.org/10.1107/S0909049511042518
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